• 专利标题:   Device for measuring physical property of fluid, has measurement system that measures surface roughness of graphene thin film, and current supply system that adds optical energy to measurement target fluid accepted in holding space.
  • 专利号:   KR1603900-B1
  • 发明人:   LEE J S, YOON H M, CHOI S B, BAIK S J, YEO J S, HAN J H
  • 专利权人:   UNIV YONSEI IND ACADEMIC COOP FOUND
  • 国际专利分类:   G01Q060/24
  • 专利详细信息:   KR1603900-B1 16 Mar 2016 G01Q-060/24 201623 Pages: 16 English
  • 申请详细信息:   KR1603900-B1 KR127610 24 Sep 2014
  • 优先权号:   KR127610

▎ 摘  要

NOVELTY - The device (100) has graphene thin film cover portion (120) that provides graphene thin film on exposed portion surface of measurement target fluid accepted in fluid fixing unit (110). Measurement system (130) measures surface roughness of film. Current supply system (140) adds optical energy or thermal energy to target fluid accepted in holding space. Holding space receives target fluid so that portion of target fluid exposes to outside. Flake type bottom plate is adhered at lower portion of flake type top plate. Holding space is formed in inner surface of cylinder piercing globe. USE - Device for measuring physical property of fluid. ADVANTAGE - The surface information of the measurement target fluid is obtained through atomic force microscopy (AFM) after the graphene thin film is positioned at the measurement target fluid surface. The surface information of the obtained measurement target fluid is undergone an operation process. The physical property of the measurement target fluid is produced and various physical properties of the measurement target fluid are produced. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are included for the following: (1) a fluid property measuring method; and (2) a fluid property measuring system. DESCRIPTION OF DRAWING(S) - The drawing shows an explanatory view of the device for measuring physical property of fluid. Device for measuring physical property of fluid (100) Fluid fixing unit (110) Graphene thin film cover portion (120) Measurement system of surface roughness (130) Current supply system (140)