• 专利标题:   Manufacture of semiconductor substrate structure involves preparing intermediate structure by forming graphene layer on diamond wafer substrate, forming hexagonal-boron nitride layer on structure and forming gallium nitride epilayer.
  • 专利号:   KR2220648-B1
  • 发明人:   LEE T, CHO S
  • 专利权人:   RFHIC CORP
  • 国际专利分类:   C30B029/40, H01L021/02
  • 专利详细信息:   KR2220648-B1 26 Feb 2021 H01L-021/02 202121 Pages: 16
  • 申请详细信息:   KR2220648-B1 KR179215 31 Dec 2019
  • 优先权号:   KR179215

▎ 摘  要

NOVELTY - Manufacture of a semiconductor substrate structure involves preparing an intermediate structure (S1) (A) by forming a graphene layer (single layer or a multilayer) directly on a diamond wafer substrate, preparing an intermediate structure (S2) (B) by forming a hexagonal-boron nitride layer (monolayer or multilayer) directly on the structure (S1), and forming a gallium nitride epilayer (C) directly on the structure (S2). USE - Manufacture of semiconductor substrate structure used for electronic and optoelectronic devices e.g. LED and laser diodes. ADVANTAGE - The method produces a semiconductor substrate structure having improved thermal characteristics between the device and substrate. The method minimizes the occurrence of bow in the structure compared to the existing structure. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for semiconductor substrate structure.