• 专利标题:   Semiconductor device e.g. metal oxide semiconductor field effect transistor, comprises graphene film that covers top surface and sidewalls of epitaxial region and covers bottom surface and side walls of metal contact.
  • 专利号:   US2022285515-A1, TW202249282-A
  • 发明人:   WOON W, KHADERBAD M A
  • 专利权人:   TAIWAN SEMICONDUCTOR MFG CO LTD, TAIWAN SEMICONDUCTOR MFG CO LTD
  • 国际专利分类:   H01L029/16, H01L029/423, H01L029/66, H01L029/786
  • 专利详细信息:   US2022285515-A1 08 Sep 2022 H01L-029/423 202275 English
  • 申请详细信息:   US2022285515-A1 US550759 14 Dec 2021
  • 优先权号:   US157540P, US550759

▎ 摘  要

NOVELTY - Semiconductor device comprises a substrate (102), a fin structure (104) on the substrate, comprising an epitaxial region (105), a metal contact above the epitaxial region, and a graphene film covering a top surface and sidewalls of the epitaxial region and covering a bottom surface and sidewalls of the metal contact. USE - Semiconductor device. ADVANTAGE - The semiconductor device has higher storage capacity, faster processing systems, higher performance, and lower costs. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a method for forming a semiconductor device, which involves forming a fin structure with an epitaxial layer on a substrate, forming a first graphene film covering a top surface and sidewalls of the epitaxial region, forming a metal contact above the epitaxial region, and forming a second graphene film covering a bottom surface and sidewalls of the metal contact. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of the field effect transistors. 100Field effect transistors 102Substrate 104Fin structure 105Epitaxial region 110Contacts