• 专利标题:   Evaluating quality of graphene using confocal laser scanning microscope, involves irradiating with laser light graphene layer formed on catalyst layer, detecting signal of light reflected from graphene layer.
  • 专利号:   US2022206276-A1, JP2022104781-A, KR2022094456-A, KR2464089-B1
  • 发明人:   WOO Y S, KIM D J, HONG B H, YU Y S, KIM D
  • 专利权人:   UNIV DANKOOK IND ACADEMIC COOP FOUND, GRAPHENE SQUARE INC, UNIV SEOUL NAT R DB FOUND, UNIV SEOUL NAT R DB FOUND, GRAPHENE SQUARE INC, UNIV DANKOOK IND ACADEMIC COOP FOUND
  • 国际专利分类:   G02B021/00, C01B032/182, G01N021/17, G01N021/65, G01N029/24, G01Q060/12
  • 专利详细信息:   US2022206276-A1 30 Jun 2022 G02B-021/00 202258 English
  • 申请详细信息:   US2022206276-A1 US501668 14 Oct 2021
  • 优先权号:   KR185690

▎ 摘  要

NOVELTY - Evaluating quality of graphene using a confocal laser scanning microscope, involves irradiating with laser light a graphene layer formed on a catalyst layer, detecting a signal of light reflected from the graphene layer, forming a planar image of the graphene layer using the detected optical signal. The contrast between graphene and the catalyst layeris analyzed in the planar image. USE - Method for evaluating quality of graphene using confocal laser scanning microscope. ADVANTAGE - The method for capable of evaluating in real time the quality of graphene, which is being continuously formed, by using a confocal laser scanning microscope.