• 专利标题:   Method for detecting graphene micro sheet distribution by using surface electron microscope, involves measuring graphene micro sheet thickness by scanning electron microscope sample table by estimating layer thickness distribution.
  • 专利号:   CN106908463-A, CN106908463-B
  • 发明人:   CHEN Q, ZENG J
  • 专利权人:   CHENGDU NEW KELI CHEM SCI CO LTD, CHENGDU NEW KELI CHEM ENG SCI TECHNIC
  • 国际专利分类:   G01N023/22, G01N023/2202, G01N023/2251
  • 专利详细信息:   CN106908463-A 30 Jun 2017 G01N-023/22 201759 Pages: 10 Chinese
  • 申请详细信息:   CN106908463-A CN11243813 09 Mar 2017
  • 优先权号:   CN11243813

▎ 摘  要

NOVELTY - The method involves preparing of powder by a mechanically peeling graphene micro sheet. Powder is uniformly spreaded on a glass slide. The graphene micro sheet is magnetized. Graphene micro sheet drying temperature is 50-60 degree Celsius. Glass slide surface orientation of the graphene micro sheet is determined. The graphene micro sheet is provided with conductive film adhesive. Graphene micro sheet thickness is measured by a high-precision scanning electron microscope sample table to scan electron microscope photograph in minimum resolution by estimating layer thickness distribution. USE - Method for detecting graphene micro sheet distribution by using a surface electron microscope. ADVANTAGE - The method enables avoiding graphene original distribution damages and reflecting graphene material layer distribution to quickly estimate multilayer graphene micro sheet and improve graphene material quality of evaluation and research scale mechanical milling, separating and preparing efficiency. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of a graphene micro sheet.