• 专利标题:   Graphene non-destructive testing method, involves extracting region in which metallic board is oxidized with light, and irradiating light in board in which graphene is synthesized on surface, and extracting oxidized board to microscope.
  • 专利号:   WO2017171195-A1, KR2017112242-A
  • 发明人:   KIM H K, KIM Y K, KIM Y N, RHYU S H
  • 专利权人:   KOREA ELECTRONICS TECHNOLOGY INST
  • 国际专利分类:   G01N021/88, G01Q060/10, G03H001/24
  • 专利详细信息:   WO2017171195-A1 05 Oct 2017 G01N-021/88 201770 Pages: 17
  • 申请详细信息:   WO2017171195-A1 WOKR014100 02 Dec 2016
  • 优先权号:   KR039029

▎ 摘  要

NOVELTY - The method involves extracting a region in which a metallic board (110) is oxidized with light (130). The light is irradiated in the metallic board in which a graphene (120) is synthesized on a surface. The oxidized metallic board is extracted to an optical microscope. USE - Graphene non-destructive testing method. ADVANTAGE - The method enables realizing graphene non-destructive inspection in an easy manner without influence turning against quality of a grapheme, so that quality inspection of a large-area graphene can be performed in a short time period. DETAILED DESCRIPTION - The metallic board is selected from nickel, cobalt, iron, platinum, gold, aluminum, chromium, copper, magnesium, manganese, silicon, tantalum, titanium, brass and bronze. INDEPENDENT CLAIMS are also included for the following: (1) a graphene non-destructive testing apparatus (2) a graphene forming method (3) a graphene manufacturing method. DESCRIPTION OF DRAWING(S) - The drawing shows a perspective view of a graphene non-destructive testing apparatus. Metallic board (110) Graphene (120) Light (130)