• 专利标题:   Semiconductor structure, has graphene layer arranged over first and second conductive features, where sidewalls of second dielectric layer are defined by graphene layer, and metal capping layer is arranged between graphene layer and features.
  • 专利号:   US2022020694-A1
  • 发明人:   SHUE S, CHEN H, LEE M, CHAN Y, YANG S
  • 专利权人:   TAIWAN SEMICONDUCTOR MFG CO LTD
  • 国际专利分类:   H01L021/768, H01L023/522, H01L023/532
  • 专利详细信息:   US2022020694-A1 20 Jan 2022 H01L-023/532 202214 English
  • 申请详细信息:   US2022020694-A1 US391216 02 Aug 2021
  • 优先权号:   US573817, US391216

▎ 摘  要

NOVELTY - A semiconductor structure comprises a first conductive feature disposed in a first dielectric layer; a second conductive features disposed in the first dieectric layer and adjacent to the first conductive feature; a graphene layer arranged over the first and the second conductive features; and a second dielectric layer disposed on the first layer. Sidewalls of the second layer are defined by the graphene layer. The structure further comprises a metal capping layer arranged between the graphene layer and the features, and a via electrically coupled to first feature. USE - Semiconductor structure. ADVANTAGE - The method enables utilizing a scaling down process to increase production efficiency and reduce associated costs. The method allows the conductive features to be formed in the interconnect structure to reduce or eliminate misalignment between the conductors, thus reducing contact resistance and improving reliability of the interconnection structure. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a method for manufacturing a semiconductor structure. DESCRIPTION OF DRAWING(S) - The drawing shows a flowchart illustrating the method for manufacturing a semiconductor structure.