• 专利标题:   Measurement object mass measuring device, has deformation unit adding tensile strain within elastic deformation area to graphene sheet, where natural frequency information of measurement object and graphene sheet are obtained.
  • 专利号:   KR2011094925-A, KR1229730-B1
  • 发明人:   KIM S Y
  • 专利权人:   UNIST ACADIND RES CORP
  • 国际专利分类:   G01G003/00, G01G003/16
  • 专利详细信息:   KR2011094925-A 24 Aug 2011 G01G-003/16 201177 Pages: 10
  • 申请详细信息:   KR2011094925-A KR014662 18 Feb 2010
  • 优先权号:   KR014662

▎ 摘  要

NOVELTY - The device has a measurement object for measuring minute mass. The object is settled in a graphene sheet. A deformation unit adds tensile strain within an elastic deformation area to the graphene sheet, where natural frequency information of the object and the graphene sheet are obtained. The deformation unit fixes an edge part of the graphene sheet, and stretches the graphene sheet so as to add establishment strain to the graphene sheet. The deformation unit adds deformation to the graphene sheet so as to increase natural frequency of the graphene sheet. USE - Measurement object mass measuring device. ADVANTAGE - The device effectively measures the mass of the measurement object using the graphene sheet with improved measuring accuracy, and increases value of the graphene sheet. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a mass measurement method. DESCRIPTION OF DRAWING(S) - The drawing shows a graphical representation of a measurement object mass measuring device. '(Drawing includes non-English language text)'.