▎ 摘　　要

NOVELTY - The method involves using chemical vapor deposition to grow single crystal graphene on a copper foil substrate to obtain graphene-copper foil sample. A probe with electronic back scattering diffraction is used to test the graphene-copper foil sample by scanning an electron microscope to obtain crystal plane orientation information of a copper foil and a graphene morphology map. The graphene morphology map is used to measure included angle in horizontal direction. Crystal plane orientation information of the copper foil is analyzed to obtain Euler angle of crystal domain of the copper foil. Analysis process is performed to obtain a surface atom arrangement image of the copper foil crystal domain after converting the Euler angle to Miller index. USE - Method for determining orientation of single crystal graphene on a copper foil substrate. ADVANTAGE - The method enables determining orientation of graphene for sample preparation with high accuracy, providing help for large-area preparation of high-quality single-crystal graphene and promoting graphene in electrical field. DESCRIPTION OF DRAWING(S) - The drawing shows a surface morphology of a graphene and copper foil.