• 专利标题:   Method for forming graphene-based FET device involves forming graphene layer within trench in substrate, to provide device structure such as FET.
  • 专利号:   US2010051960-A1, US7858990-B2
  • 发明人:   CHEN A, KRIVOKAPIC Z
  • 专利权人:   ADVANCED MICRO DEVICES INC
  • 国际专利分类:   H01L021/04, H01L029/16, H01L029/15
  • 专利详细信息:   US2010051960-A1 04 Mar 2010 H01L-029/16 201018 Pages: 12 English
  • 申请详细信息:   US2010051960-A1 US201851 29 Aug 2008
  • 优先权号:   US201851

▎ 摘  要

NOVELTY - The method involves forming a graphene layer (18) within a trench (12) in a substrate (10) made of carbon-containing material and silicon. The device structure such as FET is provided on the graphene layer. USE - Method for forming graphene-based FET device (claimed). ADVANTAGE - The need for the etching process of the graphene layer is eliminated hence the formation process of the graphene-based FET device is simplified. The shape and dimension of the graphene layer can be accurately controlled by the process of the trench structure. The bonding of the graphene layer to the substrate is performed effectively and the reliability of the graphene-based FET device is improved. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for graphene-based device. DESCRIPTION OF DRAWING(S) - The drawing shows a sectional view illustrating the method for forming graphene-based FET device. Substrate (10) Trench (12) Graphene layer (18) Gate dielectric (24) Metal contacts for gate, source and drain regions (26,28)