▎ 摘　　要

NOVELTY - The method involves selecting to-be-tested graphene material to perform tap density, X-ray diffraction and Raman spectrum test to obtain tap density of to-be-tested graphene material. X-ray diffraction and test result of a Raman spectrum are obtained. Test result is inputted to a preset model. Judging result of the to-be-tested graphene material is obtained accordance with the graphene material of an ultra capacitor. The preset model is analyzed to determine graphene material tap density. The X-ray diffraction and test result of the Raman spectrum in the ultra capacitor is analyzed using graphene material standard of correlation model. USE - Method for realizing quick evaluation and screening of graphene material of an ultra capacitor. ADVANTAGE - The method realizes quick evaluation and screening process in simple and convenient manner, ensures test process and reduces test cost. The test result is accurate. The method improved practicability.