▎ 摘　　要

NOVELTY - The method involves determining material from generation. The material is shown in a low energy domain of Raman spectrum by performing whether Raman analysis of the material is two-dimensional (2D) material or not. A position of the generation is formed with two atomic layers. The thickness of the material is determined at three atomic layers. The position of the generation is shown when thickness of the material is less than 1 nm. The thickness of the material is greater than 2 nm to prevent the position of the generation from being shown. USE - Method for validating two-dimensional (2D) material e.g. graphene, manganese disulfide, tungsten disulfide, molybdenum disulfide, and tungsten diselenide (all claimed) utilized for basic material industries. ADVANTAGE - The method enables readily providing and verifying 2D material with analysis so as to save time and cost of the Raman analysis and reduce size of elements as exaggeration. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a graphene material validation method. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view illustrating a 2D material validating method. '(Drawing includes non-English language text)'