• 专利标题:   Metal interconnection structure, has interlayer dielectric layer formed with opening, which is filled with metal material, where surface of metal material is formed with graphene layer.
  • 专利号:   CN103378064-A, CN103378064-B
  • 发明人:   FU Y, ZHANG H
  • 专利权人:   SEMICONDUCTOR MFG INT SHANGHAI CORP
  • 国际专利分类:   H01L021/768, H01L023/532
  • 专利详细信息:   CN103378064-A 30 Oct 2013 H01L-023/532 201403 Pages: 21 Chinese
  • 申请详细信息:   CN103378064-A CN10133501 28 Apr 2012
  • 优先权号:   CN10133501

▎ 摘  要

NOVELTY - The structure has an interlayer dielectric layer formed with an opening i.e. through-hole, where the interlayer dielectric layer is made of silicon dioxide, and has dielectric constant less than 2.2 of an ultra-low dielectric material, and width or height of the opening is less than 45 nm. Metal material is filled in the opening, where the metal material is copper, aluminum or tungsten. A surface of the metal material is formed with a graphene layer. A dual damascene structured groove is formed in the opening. USE - Metal interconnection structure. ADVANTAGE - The structure is provided with the graphene layer, which is attached with the copper, nickel and other metal material so as to reduce resistance simulation of the structure. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a metal interconnection structure manufacturing method. DESCRIPTION OF DRAWING(S) - The drawing shows a flow diagram illustrating a metal interconnection structure manufacturing method. '(Drawing includes non-English language text)'