• 专利标题:   Electronic structure e.g. transistor, has channel layer formed from channel material with band gap modulable by electric field, where channel layer is electrically insulated from top gate electrode and bottom gate electrode.
  • 专利号:   WO2023081966-A1
  • 发明人:   FUHRER M S
  • 专利权人:   UNIV MONASH
  • 国际专利分类:   H01L027/088, H01L027/108, H01L029/51, H01L029/66, H01L029/745, H01L029/78, H01L029/92, H01L049/00, H03K017/30
  • 专利详细信息:   WO2023081966-A1 19 May 2023 H03K-017/30 202342 Pages: 21 English
  • 申请详细信息:   WO2023081966-A1 WOAU051338 10 Nov 2022
  • 优先权号:   AU903614

▎ 摘  要

NOVELTY - The structure (100) has a source electrode (112) in electrical contact with a channel layer (106) through doped semiconductor material. A drain electrode (114) is spaced apart from the source electrode and placed in contact with the channel layer. A top gate electrode and a bottom gate electrode are configured to apply electric field across the layer in direction perpendicular to a plane of the layer. The channel material is selected from a group consisting of few-layer graphene, two-dimensional semiconductor or topological material, where the material has a staggered honeycomb lattice structure. USE - Electronic structure e.g. low-voltage field-effect transistor, for use in an electrical device (claimed), such as switches for low-power applications. ADVANTAGE - The structure reduces sub-threshold swing in topological transistor devices to reduce power dissipation and improve efficiency of the device. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are also included for: a method for operating a structure an electrical device. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of a topological quantum field effect transistor. 100Topological quantum field effect transistor 102Top gate 104Bottom gate 106Channel layer 108Ferroelectric layers 112Source electrode 114Drain electrode