• 专利标题:   Mechanical deformation measuring sensor, has one-dimensional nanometer material comprising nanometre tube, nanometre line, nanometre grain and graphene, where density of nanometer material is greater than specific value.
  • 专利号:   CN102183201-A
  • 发明人:   LI P, WANG X
  • 专利权人:   WANG X
  • 国际专利分类:   G01B007/16
  • 专利详细信息:   CN102183201-A 14 Sep 2011 G01B-007/16 201172 Pages: 8 Chinese
  • 申请详细信息:   CN102183201-A CN10040678 20 Feb 2011
  • 优先权号:   CN10040678

▎ 摘  要

NOVELTY - The sensor has a one-dimensional nanometer material comprising a nanometre tube, a nanometre line, nanometre grain and graphene. Density of the one-dimensional nanometer material is greater than 0.01 g/ml. USE - Mechanical deformation measuring sensor. ADVANTAGE - The sensor has improved sensitivity and firmness. The sensor can flexibly adjust sensitivity and measurement range of the nanometer material according to application situations. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of a mechanical deformation measuring sensor. '(Drawing includes non-English language text)'