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  • 专利标题:   Analysis of physical properties e.g. elasticity of graphene, involves providing metal substrate including grooves with flat bottom, uniformly dispersing graphene sample on substrate, and observing substrate with scanning electron microscope.
  • 专利号:   KR2019121576-A, KR2065048-B1
  • 发明人:   HUN H S, CHOI K, LEE M, KIM S T, AN W
  • 专利权人:   KOREA INST CERAMIC ENG TECHNOLOGY
  • 国际专利分类:   G01N001/28, G01N001/36, G01N021/84
  • 专利详细信息:   KR2019121576-A 28 Oct 2019 G01N-001/36 201990 Pages: 12
  • 申请详细信息:   KR2019121576-A KR045059 18 Apr 2018
  • 优先权号:   KR045059

▎ 摘　　要

NOVELTY - Analysis of physical properties of graphene involves providing a metal substrate including grooves having a flat bottom, uniformly dispersing a graphene sample on the metal substrate, and observing the metal substrate with a scanning electron microscope. USE - Analysis of physical properties such as electrical properties, optical properties, electromagnetic properties, degree of wrinkles, flatness, adhesiveness in bent state, and elasticity of graphene. ADVANTAGE - The method enables easy and effective analysis of physical properties of graphene.