▎ 摘　　要

NOVELTY - The probe has a probe cantilever (12), a probe needle point (11), a graphene thin film layer (2) and a low heat-conducting layer (3). The probe needle point is located at one end of the probe cantilever. The graphene thin film layer is coated outside the probe needle point. The low heat-conducting layer is coated outside the graphene thin film layer corresponding to the probe needle tip of probe main housing (1), while the graphene thin film layer is not coated corresponding to a tip portion of the probe needle point. USE - Atomic force microscope scanning heat probe. ADVANTAGE - The probe is enabled to increase the accuracy and resolution of the atomic force microscope thermal test. The testing process is shortened, while the probe needle tip and the sample reach heat balance time, and time resolution ratio of test is increased. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a method of preparing atomic force microscope scanning heat probe. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic diagram of the atomic force microscope scanning heat probe. Probe main housing (1) Graphene thin film layer (2) Low heat-conducting layer (3) Probe needle point (11) Probe cantilever (12)