▎ 摘　　要

NOVELTY - The method involves providing an ultra-thin graphene film. The elliptical data of graphene film is obtained by elliptical polarization technique. A proper theory model is established according to the structure of the graphene film. The obtained elliptical data is analyzed and fitted to aluminum foil stock to establish graphene film theory model base. USE - Method for measuring thickness and band structure of graphene film. ADVANTAGE - The operation of thickness and band structure measuring process can be simplified. The difficulty degree of the integrated circuit can be reduced. DESCRIPTION OF DRAWING(S) - The drawing shows an explanatory view illustrating the process for measuring thickness and band structure of graphene film. (Drawing includes non-English language text)