• 专利标题:   Preparation of patterned graphene material for transistor, by cleaning silicon carbide wafer, coating photoresist layer, placing in buffered hydrofluoric acid solution, carrying out electron beam deposition of nickel film, and patterning.
  • 专利号:   CN102936154-A
  • 发明人:   LEI T, ZHANG Y, TANG X, ZHANG K, ZHAO Y, GUO H
  • 专利权人:   UNIV XIDIAN
  • 国际专利分类:   C04B041/50, C04B041/85
  • 专利详细信息:   CN102936154-A 20 Feb 2013 C04B-041/50 201344 Pages: 9 Chinese
  • 申请详细信息:   CN102936154-A CN10480856 23 Nov 2012
  • 优先权号:   CN10480856

▎ 摘  要

NOVELTY - Preparation of a patterned graphene material comprises cleaning a silicon carbide (SiC) wafer using plasma-enhanced chemical vapor deposition (PECVD), and depositing silicon dioxide (SiO2) layer; coating a photoresist layer, and patterning; placing the samples in a quartz tube, and heating to 750-1150 degrees C; padding carbon tetrachloride (CCl4) in the flask, heating to 60-80 degrees C, and reacting for 20-100 minutes to generate carbon film; placing in a buffered hydrofluoric acid solution; carrying out electron beam deposition of nickel film; exposing to 20-100 mL/minute argon gas; and patterning. USE - Method for the preparation of a patterned graphene material for transistor. ADVANTAGE - Patterning the graphene does not need photo-etching, and can be directly carried out by electrode deposition. The method achieves high conversion speed, and produces a transistor with high mobility. DETAILED DESCRIPTION - Preparation of a patterned graphene material comprises: (A) cleaning an SiC wafer to remove surface contaminants; (B) cleaning the SiC wafer surface using PECVD, and depositing 0.4-1.2 mu m thick SiO2 layer using argon gas as a mask; (C) coating a photoresist layer on the SiO2 mask surface, carving to expose the SiC surface, and forming a pattern with the shape of a window; (D) placing the samples in a quartz tube, connecting the quartz tube with a three-mouth flask, water bath, a resistance furnace, and a reactor, and heating the quartz tube to 750-1150 degrees C; (E) padding CCl4 in the flask, heating to 60-80 degrees C, passing 40-90 mL/minute argon gas in the flask, reacting the CCl4 and SiC for 20-100 minutes, and generating carbon film; (F) placing the carbon film in a buffered hydrofluoric acid solution to remove the pattern other than the image of SiO2; (G) carrying out electron beam deposition of 350-600 nm nickel film on the carbon film as target sample; (H) exposing the film to 20-100 mL/minute argon gas at 900-1100 degrees C for 10-20 minutes; and (I) patterning sample by placing in a hydrochloric acid and copper sulfate mixed solution to remove the nickel film.