▎ 摘 要
NOVELTY - A transmission electron microscopy sample preparation method involves transferring graphene to surface of material on which transmission electron microscopy sample is prepared or performing chemical vapor deposition, utilizing graphene to avoid surface damage and contamination caused by to-be-observed material, during sample preparation and performing hand grinding or ion beam thinning or using focused ion beam system for obtaining transmission electron microscopy sample containing graphene as protective layer, if the protective layer does not affect experimental observation, it is placed directly into the transmission electron microscope for observation, where the protective layer is removed by calcining at high temperature of 550 degrees C for 2 hours. USE - Method for preparing transmission electron microscopy sample. ADVANTAGE - The method enables preparing zero-damage transmission electron microscopy sample.