▎ 摘　　要

NOVELTY - The method involves putting graphite alkenyl standard sample and to-be-detected object on upper portion of platform. The detection device (1) is set to detect synchronous movement of graphite alkenyl standard sample. The to-be-detected object detection device (2) is set to detect object. The standard sample key information and graphene lattice structure information are detected when detection device is connected with platform. The graphite alkenyl standard sample key length information is compared with displacement signal of to-be-detected object. USE - Method for measuring tracing length of sub-nanometer level graphite alkene sample and to-be-detected object. ADVANTAGE - The reference lattice length measuring source is provided with high stability. The measuring precision can be improved. The simple and reliable measuring process can be performed. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view illustrating the process for measuring tracing length of sub-nanometer level graphite alkene sample in to-be-detected object. (Drawing includes non-English language text) Graphite alkenyl standard sample detection device (1) To-be-detected object detecting device (2) Graphene standard sample moving working table (3) To-be-detected moving working table (4) Ultra precise synchronous movement linkage device system (5)