• 专利标题:   Graphene metal surface gap measuring method, involves performing wavelength value measuring process, performing voltage information recording process and graphene metal surface luminous spot information obtaining process.
  • 专利号:   CN105699702-A, CN105699702-B
  • 发明人:   FU Y, PENG P, REN L, WANG Z, GU Y, WANG K, JIA Y
  • 专利权人:   UNIV PEKING, UNIV PEKING
  • 国际专利分类:   G01N021/66, G01Q060/24
  • 专利详细信息:   CN105699702-A 22 Jun 2016 G01Q-060/24 201646 Pages: 7 Chinese
  • 申请详细信息:   CN105699702-A CN10709646 27 Nov 2014
  • 优先权号:   CN10709646

▎ 摘  要

NOVELTY - The method involves arranging a compound single layer graphene film on a graphene metal surface. A sample table is connected with an electric conduction atom force microscope. The graphene metal surface is fixed with a probe and electric conduction circuit. Determination is made to check whether a measured electric current value in lesser than a preset maximum current value. Minimum spectrograph wavelength value measuring process is performed. Voltage information recording process is performed. Graphene metal surface luminous spot information obtaining process is performed. USE - Graphene metal surface gap measuring method. ADVANTAGE - The method enables realizing metal surface gap measuring process in a simple and efficient manner. DESCRIPTION OF DRAWING(S) - The drawing shows a flowchart illustrating a graphene metal surface gap measuring method. '(Drawing includes non-English language text)'