• 专利标题:   Regulating reflectance of graphene plasmons comprises controlling the geometry of the graphene layer or by changing the refractive index of the material of the substrate layer disposed on the boundary below the graphene layer.
  • 专利号:   CN109721050-A
  • 发明人:   DAI Q, HU H, HU D, YANG X, GUO X
  • 专利权人:   NAT CENT NANOSCIENCE TECHNOLOGY CHINA
  • 国际专利分类:   C01B032/194
  • 专利详细信息:   CN109721050-A 07 May 2019 C01B-032/194 201949 Pages: 13 Chinese
  • 申请详细信息:   CN109721050-A CN10069434 24 Jan 2019
  • 优先权号:   CN10069434

▎ 摘  要

NOVELTY - Regulating reflectance of graphene plasmons comprises controlling the geometry of the graphene layer or by changing the refractive index of the material of the substrate layer disposed on the boundary below the graphene layer. USE - The method is useful for regulating reflectance of graphene plasmons. ADVANTAGE - The method: can adjust the reflectance of graphene plasmons from 10% nanometer to 80%; has high modulation efficiency; and is simple and easy. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for preparing the plasmons component that implements the method of regulating the reflectivity of graphene plasmons, comprising (i) selecting base layer material, and preparing the base layer, (ii) preparing pore structure on the base layer, (iii) placing sample graphene layer on the base layer and covering the pores to form a suspended graphene layer, (iv) changing the pressure in the pores under the graphene layer to change the geometry of the graphene layer, and adjusting the spacing between the layers and the substrate layer, (v) obtaining interference image of the plasmon, (vi) extracting electric field distribution of the graphene plasmon by near-field image, and obtaining numerical value of the reflectance by using data fitting method, the method used to obtain the plasmon interference image is: scattering light from a tip of a near-field optical microscope using a mid-infrared scattering type directly excites a plasmon or illuminates a plasmon by irradiating a boundary of a hole in the graphene layer of the sample with incident infrared light, where the surface of the graphene layer sample is scanned using the mid-infrared scattering type scanning near-field optical microscope tip to measure the interference pattern of the plasmon wave supported on the graphene layer.