• 专利标题:   Metal ion detection method involves preparing fluorescent probe array using graphene quantum dots and doped graphene quantum dots, recording changes in fluorescence intensity of graphene quantum dots, and detecting metal ions.
  • 专利号:   CN111551532-A
  • 发明人:   JI H, WUMING M, WANG Q, LIU J, ZHOU X, QIN Y, WU L
  • 专利权人:   UNIV NANTONG
  • 国际专利分类:   B82Y020/00, B82Y030/00, B82Y040/00, C09K011/65, C09K011/70, G01N021/64
  • 专利详细信息:   CN111551532-A 18 Aug 2020 G01N-021/64 202072 Pages: 15 Chinese
  • 申请详细信息:   CN111551532-A CN10574358 22 Jun 2020
  • 优先权号:   CN10574358

▎ 摘  要

NOVELTY - Metal ion detection method involves preparing graphene quantum dots by hydrothermal method, preparing nitrogen-doped graphene quantum dots, phosphorus-doped graphene quantum dots, sulfur-doped graphene quantum dots and boron-doped graphene quantum dots using graphene quantum dots as raw materials, preparing a fluorescent probe array using graphene quantum dots and doped graphene quantum dots, recording the changes in fluorescence intensity of the graphene quantum dots caused by several metal ions, and detecting and distinguishing metal ions using linear discriminant analysis. USE - Metal ion detection method based on graphene quantum dot fluorescent probe array. ADVANTAGE - The method detects metal ion with excellent controllability, in a short period of time. The graphene quantum dot fluorescent probe array is economically prepared by simple process, and distinguishes metal ions with high accuracy.