• 专利标题:   Substrate material refractive index measuring method for e.g. chemical field, involves adhering two-dimension structure of graphene to prism, and adhering graphene to transparent sheet.
  • 专利号:   CN102692393-A, CN102692393-B
  • 发明人:   DENG Z, LIU Z, TIAN J, XING F, YE Q
  • 专利权人:   UNIV NANKAI
  • 国际专利分类:   G01N021/41
  • 专利详细信息:   CN102692393-A 26 Sep 2012 G01N-021/41 201308 Pages: 6 Chinese
  • 申请详细信息:   CN102692393-A CN10196836 15 Jun 2012
  • 优先权号:   CN10196836

▎ 摘  要

NOVELTY - The method involves adhering a two-dimension structure of graphene to a prism having different absorption of S-polarized and P-polarized lights. Refractive index of a substrate material is measured according to graphene polarization effect in real time by measuring difference of the polarized lights. The graphene is adhered to a transparent sheet. The prism is combined with an upper flange. A convex lens is utilized for focusing an incident light. USE - Method for measuring refractive index of a substrate material based on graphene polarization absorption effect for biological and chemical fields. ADVANTAGE - The method enables monitoring refractive index of the substrate material in real-time without a motor when refractive index s-polarized and p-polarized electric signal difference is changed. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a real time graphene polarization absorption effect measuring refractive index measuring device. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic illustration of a real time graphene polarization absorption effect measuring refractive index measuring method.'(Drawing includes non-English language text)'