• 专利标题:   Semiconductor structure e.g. through silicon via structure for use in high frequency transmission, has substrate, via penetrating through substrate, liner layer formed on sidewall of via, barrier layer comprising conductive two-dimensional material, and conductor filling remaining space of via.
  • 专利号:   US2023079160-A1, CN115939077-A
  • 发明人:   LEE D, WANG Y, LU C, LI D, LV Z
  • 专利权人:   MACRONIX INT CO LTD, MACRONIX INT CO LTD
  • 国际专利分类:   H01L021/48, H01L023/498, H01L021/768, H01L023/538
  • 专利详细信息:   US2023079160-A1 16 Mar 2023 H01L-023/498 202326 English
  • 申请详细信息:   US2023079160-A1 US475439 15 Sep 2021
  • 优先权号:   US475439

▎ 摘  要

NOVELTY - Semiconductor structure (100) has a substrate (110), a via (120) penetrating through the substrate, a liner layer (130) formed on a sidewall of the via, a barrier layer (140) comprising a conductive two-dimensional material and formed on the liner layer, and a conductor filling a remaining space of the via. Resistivity of the conductive two-dimensional (2D) material is equal to or lower than 0.25 Ω.µm. The conductive 2D material is graphene or a transition metal dichalcogenide. USE - Semiconductor structure e.g. through silicon via structure for use in high frequency transmission. ADVANTAGE - The structure provides a higher transmission efficiency. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a method for manufacturing a semiconductor structure, which involves: (a) forming a via through a substrate; (b) forming a liner layer on a sidewall of the via; (c) forming a barrier layer on the liner layer using a conductive 2D material; (d) forming a conductor in a remaining space of the via. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of the semiconductor structure.