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  • 专利标题:   Stress measurement device comprises graphene, flexible substrate, laser, spectrophotometer, object and monocrystalline silicon.
  • 专利号:   CN103630272-A, CN103630272-B
  • 发明人:   XU K, MA F, MA D, LIAN L
  • 专利权人:   UNIV XIAN JIAOTONG
  • 国际专利分类:   C23C016/26, G01B011/16, G01L001/04
  • 专利详细信息:   CN103630272-A 12 Mar 2014 G01L-001/04 201429 Chinese
  • 申请详细信息:   CN103630272-A CN10549065 07 Nov 2013
  • 优先权号:   CN10549065

▎ 摘　　要

NOVELTY - Stress measurement device comprises graphene (1), flexible substrate (2), laser (3), spectrophotometer (4), object (5) and monocrystalline silicon (6). USE - Stress measurement device. ADVANTAGE - The device is simple, stable and has high precision measurement. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for manufacture of stress measurement device. DESCRIPTION OF DRAWING(S) - The drawing shows a structure schematic diagram of stress measurement device. Graphene (1) Flexible substrate (2) Laser (3) Spectrophotometer (4) Object (5) Monocrystalline silicon (6)