• 专利标题:   Patterned graphene forming method, involves doping semiconductor silicon substrate with carbon element that is formed with patterned carbon-containing layer, where patterned carbon-containing layer is formed as patterned graphene layer.
  • 专利号:   CN103378001-A, CN103378001-B
  • 发明人:   WANG D, ZHANG H
  • 专利权人:   SEMICONDUCTOR MFG INT SHANGHAI CORP
  • 国际专利分类:   H01L021/8232
  • 专利详细信息:   CN103378001-A 30 Oct 2013 H01L-021/8232 201403 Pages: 10 Chinese
  • 申请详细信息:   CN103378001-A CN10120466 23 Apr 2012
  • 优先权号:   CN10120466

▎ 摘  要

NOVELTY - The method involves patterning a semiconductor silicon substrate. The semiconductor silicon substrate is doped with a carbon element that is formed with a patterned carbon-containing layer. The patterned carbon-containing layer is formed as a patterned graphene layer. Depth of the carbon-containing layer is less than 10 nm. Laser annealing process is performed by an yttrium aluminum garnet (YAG) laser beam. A patterned mask is removed after completing the laser annealing process. The semiconductor silicon substrate is formed with multiple trenches. USE - Patterned graphene forming method. ADVANTAGE - The method enables quickly realizing patterned graphene forming process. DESCRIPTION OF DRAWING(S) - The drawing shows a flow diagram illustrating a patterned graphene forming method.'(Drawing includes non-English language text)'