• 专利标题:   Graphene inspection apparatus has detection unit that detects deformity occurrence of graphene based on heat distribution data.
  • 专利号:   KR2012094708-A
  • 发明人:   WON D K, KIM N Y
  • 专利权人:   SAMSUNG TECHWIN CO LTD
  • 国际专利分类:   G01N025/20, G01N025/72
  • 专利详细信息:   KR2012094708-A 27 Aug 2012 G01N-025/72 201259 Pages: 10
  • 申请详细信息:   KR2012094708-A KR014141 17 Feb 2011
  • 优先权号:   KR014141

▎ 摘  要

NOVELTY - The graphene inspection apparatus has data acquisition unit that acquires heat distribution data of the graphene in which the current is applied. The detection unit detects the deformity occurrence of the graphene based on heat distribution data. USE - Graphene inspection apparatus. ADVANTAGE - The efficiency of the apparatus is improved, and the graphene quality is improved. DESCRIPTION OF DRAWING(S) - The drawing shows a block diagram of the graphene inspection apparatus. (Drawing includes non-English language text)