• 专利标题:   Method for regulating and controlling secondary harmonic signal of transition metal sulfide, involves providing transition metal sulfide/two-dimensional dielectric material heterojunction on substrate and measuring secondary harmonic signal.
  • 专利号:   CN112255859-A, CN112255859-B
  • 发明人:   LIU K, WU C, HONG H, ZHAO Z
  • 专利权人:   UNIV PEKING
  • 国际专利分类:   G02F001/355, G02F001/37
  • 专利详细信息:   CN112255859-A 22 Jan 2021 G02F-001/37 202125 Pages: 9 Chinese
  • 申请详细信息:   CN112255859-A CN11071334 09 Oct 2020
  • 优先权号:   CN11071334

▎ 摘  要

NOVELTY - The method comprises (i) providing a transition metal sulfide/two-dimensional dielectric material heterojunction, where the transition metal sulfide/two-dimensional dielectric material heterojunction is set on substrate, transition metal sulfide is located on one surface of substrate, two-dimensional dielectric material is located on one side of the transition metal sulfide away from substrate, transition metal sulfide comprises molybdenum disulfide, molybdenum selenide, molybdenum sulfide, tungsten sulfide, tungsten selenide or alloy compound, and two-dimensional dielectric material comprises graphene or hexagonal boron nitride; and (ii) measuring secondary harmonic signal of the transition metal sulfide/two-dimensional dielectric material heterojunction, where the second harmonic signal of heterojunction in tuned excitation light wavelength range is 1100-1280nm than intrinsic second harmonic signal of the transition metal sulfide. The substrate is a silicon dioxide/silicon substrate. USE - The method is useful for regulating and controlling secondary harmonic signal of transition metal sulfide. ADVANTAGE - The method changes the nonlinear optical response by transferring the graphene or other two-dimensional dielectric material to the single-layer transition metal sulfide. The nonlinear signal of the transition metal sulfide can have a change of 0.5-2 times after transferring the single-layer graphene or other two-dimensional dielectric material. The influence is reduced along with the reduction of the dielectric constant of the two-dimensional material. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic representation of the measurement results of the wavelength-dependent enhancement factor.