• 专利标题:   Preparation of fluorinated graphene/high-k dielectric composite structure involves selecting semiconductor substrate, preparing single-layer graphene, performing fluorination treatment and rapid annealing treatment to graphene.
  • 专利号:   CN111554573-A
  • 发明人:   CAO D, LIU F, YANG J, SHI H, ZHANG Y, LIU D, SHI W
  • 专利权人:   UNIV SHANGHAI NORMAL
  • 国际专利分类:   H01L021/28, H01L021/285, H01L029/51
  • 专利详细信息:   CN111554573-A 18 Aug 2020 H01L-021/28 202076 Pages: 9 Chinese
  • 申请详细信息:   CN111554573-A CN10338557 26 Apr 2020
  • 优先权号:   CN10338557

▎ 摘  要

NOVELTY - Preparation of fluorinated graphene/high-k dielectric composite structure involves (1) selecting a semiconductor substrate, (2) preparing single-layer graphene and transferring to the substrate, (3) performing the fluorination treatment to the graphene using atomic layer deposition (ALD) plasma mode, (4) growing a nano-thickness high-k dielectric layer on the surface of the fluorinated graphene in situ using thermal growth mode of ALD, and (5) performing high temperature rapid annealing treatment. USE - Preparation of fluorinated graphene/high-k dielectric composite structure. ADVANTAGE - The method enables preparation of fluorinated graphene/high-k dielectric composite structure having excellent passivation characteristics, effectively inhibits the growth of the interface layer, reduces the interface state density, and suppresses current leakage.