▎ 摘　　要

NOVELTY - The method involves specifying a zero point of a diffraction angle with respect to powder X-ray-diffraction data of a graphite raw material. In assumption that the face distance of the graphene sheet which forms the graphite raw material and the crystal structure in the graphene sheet, is the same in any graphite layer mixed in the graphite raw material, a peak position peculiar to a hexagonal system graphite layer and a rhombohedral-system graphite layer is calculated from the zero point. The integrated intensity in the peak position is computed, and a determination process is carried out to check whether the graphite raw material is a graphene precursor based on the integrated intensity. The zero point of the diffraction angle and the peak position of the diffraction line which makes several graphene sheets as a lattice surface, is specified. USE - Determination method of graphene precursor. ADVANTAGE - The peak resolution is determined efficiently by the peak profile fitting reliably, using powder X-ray-diffraction pattern with respect to a graphite raw material. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are included for the following: (1) a determination apparatus of graphene precursor; and (2) a determination program of graphene precursor. DESCRIPTION OF DRAWING(S) - The drawing shows a flowchart of the determination method of graphene precursor. (Drawing includes non-English language text) Measuring powder diffraction pattern (S1) Calculating peak position perpendicular to c-axis (S2) Setting initial values for peak shape parameters (S6) Refining by order of non-divergence of parameters (S7) Displaying ratio for peaks (S9)