• 专利标题:   Etching thick-film material nanopattern involves transferring film material to substrate, spin coating polymethylmethacrylate resist, performing electron beam photoetching pattern, evaporating aluminum film on surface of photoetched pattern, and performing inductively coupled plasma etching.
  • 专利号:   CN114604820-A
  • 发明人:   PENG L, WU S, CAO X, XU Y
  • 专利权人:   UNIV ZHEJIANG
  • 国际专利分类:   B81C001/00, B82Y030/00, B82Y040/00, G03F007/095
  • 专利详细信息:   CN114604820-A 10 Jun 2022 B81C-001/00 202276 Chinese
  • 申请详细信息:   CN114604820-A CN10225160 09 Mar 2022
  • 优先权号:   CN10225160

▎ 摘  要

NOVELTY - Etching thick-film material nanopattern involves: transferring the film material to a substrate; spin coating polymethylmethacrylate resist (AR-P 669.04) at 600 rpm for 10 seconds and 6000 rpm for 60 seconds, then baking in oven at 150°C for 1 hour, then spin coating polymethylmethacrylate (AR-P 679.03) at 600 rpm for 10 seconds and 6000 rpm for 60 seconds, baking on hot plate at 150°C for 3 minutes, and exposing to form an inverted trapezoid structure; performing electron beam photoetching pattern on the spin coated thin film material; evaporating 50 nm thick aluminum film on the surface of the photoetched pattern using an electron beam; stripping with acetone to remove aluminum on the portion with electron beam glue, and then performing inductively coupled plasma etching; and removing the surface electron beam evaporated aluminum film using chlorine gas at 200°C to obtain etched film structure. USE - The method is useful for etching thick-film material nanopattern. ADVANTAGE - The method can etch thin film with a thickness of several tens of nanometers, and solves the problem that the patterned etching of the nano-scale film can only etch single layer or few layers of two-dimensional materials.