• 专利标题:   Photomask pellicle for protecting photomask in exposure process using light including extreme UV (EUV), has nanocrystalline graphene that comprises nanocrystalline crystal grains and grains comprise two dimensional carbon structure.
  • 专利号:   KR1813186-B1, US2018149966-A1, EP3330796-A1, CN108121153-A, JP2018092155-A
  • 发明人:   SHIN H J, SONG H J, PARK S J, SHIN K W, LEE C S, SHIN H, SONG H, PARK S, SHIN K, LEE C
  • 专利权人:   SAMSUNG ELECTRONICS CO LTD, SAMSUNG ELECTRONICS CO LTD, SAMSUNG ELECTRONICS CO LTD
  • 国际专利分类:   G03F001/00, G03F001/62, G03F007/20, H01L021/02, H01L021/033, H01L029/06, H01L029/16, G03F001/22, G03F001/64, G03F007/00, B65D085/30
  • 专利详细信息:   KR1813186-B1 28 Dec 2017 G03F-001/62 201804 Pages: 31
  • 申请详细信息:   KR1813186-B1 KR162297 30 Nov 2016
  • 优先权号:   KR162297

▎ 摘  要

NOVELTY - The pellicle (P100) has a pellicle membrane (PM10) that comprises a nanocrystalline graphene having defects. The nanocrystalline graphene comprises nanocrystalline crystal grains and the grains comprise a two dimensional carbon structure having an aromatic ring structure. The defect of the nanocrystalline graphene is sp3 carbon (C) atom, oxygen (O) atom, nitrogen (N) atom, and carbon vacancy. The pellicle for a photomask comprises two pellets. USE - Photomask pellicle for protecting photomask in exposure process using light including extreme UV (EUV). ADVANTAGE - The pellicle for the photomask having the excellent surface uniformity can be implemented. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are included for the following: (1) a reticle; and (2) an exposure apparatus for lithography. DESCRIPTION OF DRAWING(S) - The drawing shows a cross-sectional view of the reticle including the pellicle for the photomask. Pellicle (P100) Pellicle membrane (PM10)