▎ 摘　　要

NOVELTY - The method involves sensing current and a Hall current in grapheme. Radiation is measured by comparing the Hall current of an electromagnetic wave and an incident electromagnetic wave to obtain mobility of the grapheme. A projection position of the electromagnetic wave is triggered and multi-point measuring is carried out. A wafer is placed on the carrier and aligned to an electromagnetic wave emitter. A reflected energy adjusting device parameter is obtained. USE - Method for performing non-contact-type Hall effect measurement of graphene migration rate of a semiconductor current carrier. ADVANTAGE - The method enables performing non-contact electromagnetic wave measurement, thus saving measuring time and ensuring better graphene consistency, strong practicability, strong popularization and application value. DESCRIPTION OF DRAWING(S) - The drawing shows a flowchart illustrating a method for performing non-contact-type Hall effect measurement of graphene migration rate of semiconductor current carrier. '(Drawing includes non-English language text)'