• 专利标题:   Manufacture of field effect transistor for e.g. sensing device, involves forming multilayer graphene stack on base substrate face, depositing drain electrode, obtaining partially fluorinated graphene block and depositing gate electrode.
  • 专利号:   EP3206232-A1, WO2017137248-A1, US2019035907-A1
  • 发明人:   BOUTCHICH M, OUERGHI A, LAI C, HO K
  • 专利权人:   CNRS CENT NAT RECH SCI, SUPELEC, UNIV CURIE PARIS VI P M, UNIV CURIE PIERRE MARIE UPMC, CNRS CENT NAT RECH SCI, SUPELEC, UNIV CURIE PARIS VI P M
  • 国际专利分类:   H01L029/16, H01L029/423, H01L029/66, H01L029/778, H01L021/02, H01L021/308, H01L029/40, H01L021/027, H01L021/3065
  • 专利详细信息:   EP3206232-A1 16 Aug 2017 H01L-029/423 201757 Pages: 25 English
  • 申请详细信息:   EP3206232-A1 EP305161 12 Feb 2016
  • 优先权号:   EP305161

▎ 摘  要

NOVELTY - Manufacture of field effect transistor involves forming a multilayer graphene stack having predefined thickness, on a face of a base substrate, depositing a source electrode (20) and a drain electrode (30), obtaining, by fluorinating, a graphene block partially fluorinated from multilayer graphene stack and depositing a gate electrode. The graphene block partially fluorinated comprises a fluorographene portion forming a dielectric element within the graphene block. USE - Manufacture of field effect transistor. Uses include but are not limited to non-volatile memory, photodetector, chemical detector, and energy-harvesting device. ADVANTAGE - The method produces field effect transistor having excellent electrostatic properties. The transistor contains multilayer graphene stack having high quality, reduced defects between layers and excellent layer interfaces. During the process, the process of fluorinating converts lateral walls of the graphene block into fluorographene, enabling the conductive channel to be insulated from its surroundings, thus risk of shortcut of the conductive channel and the scattering of electrons at the channel edges are reduced for improving carrier mobility. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view explaining manufacture of field effect transistor. Source electrode (20) Drain electrode (30) Gate dielectric (50)