▎ 摘　　要

NOVELTY - The method involves preparing test specimens having a reference graphene film covered on an insulator substrate with a different area of reference film. The resonance curve which is a correspondence relationship between the frequency of the incident microwave and the reflection intensity of the reflected wave of the microwave and the transmission intensity of the transmitted wave is obtained for each of the test specimens by cavity resonator perturbation method. The Q-value is obtained according to the specified formula from the half width of the line. The correspondence relationship between an inverse number of the Q-value and an area of reference film is obtained. The resonance curve is obtained by a cavity resonator perturbation method for a measurement object having film formed on an insulator substrate and Q-value is obtained according to the predetermined formula. The area of the film of the measurement object is obtained based on the correspondence relationship. USE - Method for measuring area of graphene. ADVANTAGE - The coated area of graphene on devices of sizes exceeding the millimeter scale on various solid substrates can be directly quantified in a short time. DETAILED DESCRIPTION - The reference graphene film is a single layer, and the graphene film of the measurement object is a single layer. The reference graphene film is multilayer graphene laminated in two or more layers, and the graphene film of the measurement object is multilayer graphene in which two or more layers are laminated. An INDEPENDENT CLAIM is included for a manufacturing method of device involves arranging graphene on an insulator substrate to produce graphene film. The area of the graphene film is measured by the graphene area measuring method. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of the measurement result of the coating area of graphene. (Drawing includes non-English language text)