• 专利标题:   Graphene inspection apparatus for use in graphene check system, has data acquisition unit for acquiring heat distribution data of graphene, in which current is applied, where detection unit detects deformity occurrence of graphene.
  • 专利号:   KR2017117931-A, KR1874389-B1
  • 发明人:   KIM N Y, WON D K
  • 专利权人:   HANWHA TECHWIN CO LTD, HANWHA AEROSPACE CO LTD
  • 国际专利分类:   G01N025/48, G01N025/72, G01N035/10
  • 专利详细信息:   KR2017117931-A 24 Oct 2017 G01N-025/48 201776 Pages: 11
  • 申请详细信息:   KR2017117931-A KR126135 28 Sep 2017
  • 优先权号:   KR014141, KR126135

▎ 摘  要

NOVELTY - The graphene inspection apparatus (10) comprises a data acquisition unit (120) for acquiring heat distribution data of graphene (G), in which the current is applied. A detection unit (130) is provided for detecting the deformity occurrence of the graphene based on heat distribution data of the graphene. A receiving unit (131) is provided for receiving heat distribution data of the graphene from the data acquisition unit. A determining unit (132) determines the deformity occurrence of the graphene. The data acquisition unit measures the thermal radiation generated in the graphene. USE - Graphene inspection apparatus for use in graphene check system (Claimed). ADVANTAGE - The graphene inspection apparatus comprises a data acquisition unit for acquiring heat distribution data of graphene, in which the current is applied, and thus enables reducing the deformity about the graphene to the simple configuration in the fast time, and also improving the efficiency of the graphene quality inspection of the massively produced large area. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a graphene check system comprises transfer apparatus. DESCRIPTION OF DRAWING(S) - The drawing shows a block diagram of a graphene inspection apparatus. (Drawing includes non-English language text). Graphene inspection apparatus (10) Data acquisition unit (120) Detection unit (130) Receiving unit (131) Determining unit (132) Graphene (G)