• 专利标题:   Semiconductor structure for use in metal-insulator-metal capacitor, comprises nanofog oxide adhered to inert two-dimensional or three-dimensional surface, or weakly reactive metal surface, and oxide layer on nanofog oxide, where nanofog oxide comprises essentially aluminum oxide nanoparticles.
  • 专利号:   US2022319830-A1
  • 发明人:   KUMMEL A, SARDASHTI K, KWAK I
  • 专利权人:   UNIV CALIFORNIA
  • 国际专利分类:   B82Y010/00, H01L021/02, H01L021/28, H01L021/3105, H01L027/24, H01L029/06, H01L029/16, H01L029/24, H01L029/423, H01L029/49, H01L029/51, H01L029/66, H01L029/775, H01L029/778, H01L029/786, H01L043/12, H01L045/00
  • 专利详细信息:   US2022319830-A1 06 Oct 2022 H01L-021/02 202285 English
  • 申请详细信息:   US2022319830-A1 US397640 09 Aug 2021
  • 优先权号:   US429938P, US397640

▎ 摘  要

NOVELTY - A semiconductor structure comprises a nanofog oxide adhered to an inert two-dimensional or three-dimensional surface, or a weakly reactive metal surface, where the nanofog oxide comprises essentially 0.5-2 nm aluminum oxide nanoparticles. USE - Semiconductor structure for use in metal-insulator-metal (MIM) capacitor, FET, metal oxide semiconductor capacitors (MOSCAP), fin FET, and nanowire FET. ADVANTAGE - The semiconductor structure has improved dielectric properties, and forms aluminum oxide film with defect-free, and uniform characteristics.