▎ 摘　　要

NOVELTY - The device has a probe sleeve (3) provided with a sleeve cavity and a sleeve limiting component. The sleeve limiting component is connected with a bottom end of the sleeve cavity. A probe spring (2) is connected with the sleeve cavity. A probe needle shaft (4) is provided with a needle shaft main body, a needle shaft clamping component and a needle shaft end component. The needle shaft clamping component is connected with an upper end of the needle shaft main body. An end of the probe spring is connected with a probe top end cover (1), where another end of the probe spring is fixed with a top end plane of the probe needle shaft and the needle shaft end component is a hemispherical needle tip or circular cross-section semispherical arc-shaped surface or circular truncated plane surface. USE - Probe device for measuring graphene thin film material resistivity used in graphene electric detecting device. ADVANTAGE - The device reduces damage to the graphene thin film material surface. The device has simple operation and convenient mounting process and using process. The needle shaft clamping component is tightly and coaxially connected with the inner wall of the sleeve cavity. The probe top end cover is installed on the top end of the probe sleeve cavity after the probe spring is installed for ensuring tight fit with the needle shaft cavity and maintaining resistance of the measuring probe without influenced by the resistance of probe device. DESCRIPTION OF DRAWING(S) - The drawing shows a side sectional view of a probe device. Probe top end cover (1) Probe spring (2) Probe sleeve (3) Probe needle shaft (4)