▎ 摘　　要

NOVELTY - The apparatus has an optic process part (100) for irradiating a terahertz wave in a graphene. A graphene conductivity inspection part is provided with a display unit (300). A determining unit (200) detects the terahertz wave from the optic process part and oxidation and reducing zone of the graphene. An optical emitter (101) emits light source of the terahertz wave. An optical sensor (102) is positioned in an upper portion of a fixing unit. A detection unit (201) detects permeability of the terahertz wave that penetrates the graphene from the optic process part. USE - Graphene conductivity inspection apparatus. ADVANTAGE - The terahertz wave is irradiated in the graphene so as to measure graphene permeability oxidation, reduce zone of the large-area graphene within time and detect electric conductance of the graphene. The apparatus reduces repair time of the graphene and saves total testing time and cost of the graphene in an oxidative region. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a graphene conductivity testing method. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of a graphene conductivity inspection apparatus. '(Drawing includes non-English language text)' Optic process part (100) Optical emitter (101) Optical sensor (102) Determining unit (200) Detection unit (201) Display unit (300)