• 专利标题:   Method for judging specific layer graphene within ten layers according to optical microscope image, involves comparing experimental contrast value with theoretical contrast value of different layer number of graphite.
  • 专利号:   CN114544629-A
  • 发明人:   XIA L, WANG C, XIE J, SHE J, ZHAN F, MENG G
  • 专利权人:   UNIV XIAN JIAOTONG
  • 国际专利分类:   G01N021/84
  • 专利详细信息:   CN114544629-A 27 May 2022 G01N-021/84 202254 Chinese
  • 申请详细信息:   CN114544629-A CN10165055 22 Feb 2022
  • 优先权号:   CN10165055

▎ 摘  要

NOVELTY - The method involves calculating a theoretical contrast value of different layers graphene under a special base according to a theoretical formula. A specific substrate and a known layer number of graphene microscope image under the specific substrate are obtained under the same light source. Multiple R, G, B stimulation values are extracted for the optical microscope picture. A relative stimulation value is calculated. An experimental contrast value is obtained according to the R and G and B relative stimulation values. A number of the graphene is determined. USE - Method for judging specific layer graphene within ten layers according to optical microscope image. Uses include but are not limited to photoelectricity field, biomedicine field, energy storage field and lithium battery field. ADVANTAGE - The method has simple operation, high accuracy and low cost, is convenient to operate, has simple and convenient to operation, and does not need to test the data of the characteristic peaks of the 2D after the Raman spectrum is tested. DESCRIPTION OF DRAWING(S) - The drawing shows a flow chart illustrating a method for judging specific layer graphene within ten layers according to optical microscope image (Drawing includes non-English language text).