• 专利标题:   GAN MMIC device manufacturing method, involves etching whole device active area edge to expose graphene buried radiating layer and connecting with devices, and sintering metal in rear board and heat sink.
  • 专利号:   CN107170673-A
  • 发明人:   JI S, LI B, LI M, NI W, NIU X, YUAN J, ZHANG J
  • 专利权人:   BEIJING HUAJIN CHUANGWEI ELECTRONIC CO
  • 国际专利分类:   H01L021/285, H01L021/335, H01L023/373, H01L029/45, H01L029/778
  • 专利详细信息:   CN107170673-A 15 Sep 2017 H01L-021/285 201774 Pages: 8 Chinese
  • 申请详细信息:   CN107170673-A CN10357170 19 May 2017
  • 优先权号:   CN10357170

▎ 摘  要

NOVELTY - The method involves placing a substrate for growing an AlN layer on a substrate slice. A graphene buried radiating layer is deposited on the AlN layer. An AlN insulation layer is formed in a GAN buffer layer, a channel layer and an AlGAN barrier layer. GaN and MMIC device is manufactured. The buried radiating layer is arranged after source electrode. A whole device active area edge is etched to expose the buried radiating layer and connecting with the devices. A metal is sintered to a rear board and a heat sink. The substrate and the ALN insulation layer are formed with the ALN layer. USE - GAN MMIC device manufacturing method. ADVANTAGE - The method enables avoids complex process in rear surface, realize front direct source- ground by utilizing graphene thermal conductivity, generating heat conduct in a device active region, and reducing high-power and temperature in GAN device. DESCRIPTION OF DRAWING(S) - The drawing shows a sectional view of a GAN MMIC device. '(Drawing includes non-English language text)'