▎ 摘　　要

NOVELTY - The utility model claims a semiconductor chip test tool, comprising multiple test piece main body and a test piece fixing element for fixing the test piece main body, the adjacent test piece main body are arranged at intervals; the test piece main body is made of graphene or graphene-copper alloy, comprising a test part; an electric connecting part and a fixing part; the test part and the electric connecting part are respectively located at two ends of the fixing part. The semiconductor chip test tool in the solution uses graphene or graphene-copper alloy as main material, which can greatly improve the test piece radiating effect, so as to ensure the service life; The semiconductor chip testing tool can be applied to the high-power device test.