• 专利标题:   Graphene insert layer structure based gallium nitride growing method involves growing high temperature gallium nitride on low temperature gallium nitride substrate by metal organic chemical vapor deposition method.
  • 专利号:   CN108428618-A
  • 发明人:   ZHANG J, XU X, CHEN Z, NING J, WANG D, HAO Y
  • 专利权人:   UNIV XIDIAN
  • 国际专利分类:   H01L021/02
  • 专利详细信息:   CN108428618-A 21 Aug 2018 H01L-021/02 201862 Pages: 11 Chinese
  • 申请详细信息:   CN108428618-A CN10218102 16 Mar 2018
  • 优先权号:   CN10218102

▎ 摘  要

NOVELTY - The method involves placing a sapphire substrate in a magnetron sputtering system with predetermined reaction chamber pressure. The nitrogen and argon gas are introduced into the magnetron sputtering system to obtain a treated sapphire substrate. The magnetron sputtering aluminum nitride is applied on the treated sapphire substrate to obtain a magnetron sputtering aluminum nitride substrate. The heat treatment of the substrate is performed. The substrate covered with graphene is placed in a metal organic chemical vapor deposition reaction chamber. The pressure of the reaction chamber is adjusted. The high temperature gallium nitride is grown on the low temperature gallium nitride substrate by metal organic chemical vapor deposition method. The sample is taken out to obtain gallium nitride based on the graphene intercalation structure, after the temperature of the reaction chamber is lowered to room temperature. USE - Graphene insert layer structure based gallium nitride growing method. ADVANTAGE - High quality gallium nitride epitaxial layer is obtained under the premise of low process steps, low cost and at good process repeatability. DESCRIPTION OF DRAWING(S) - The drawing shows a block flow diagram illustrating the gallium nitride growing process. (Drawing includes non-English language text)