▎ 摘　　要

NOVELTY - The system has light source system provided with a diode laser, a titanium gemstone laser, an optical parametric amplifier, a first optical device (1), a third optical device (3) and a fourth optical device (4). A differential system is provided with a displacement platform, a chopper, a phase-locked amplifier and a second optical device (2). A modulation detection system is provided with a heterojunction sample, a microscopic objective lens, a camera, a fifth optical device (5), a sixth optical device (6), a seventh optical device (7), an eighth optical device (8) i.e. filter sheet, a ninth optical device (9) i.e. reflector and an optical detector. The diode laser is connected with the titanium-gemstone laser. The diode laser is used for exciting the titanium-gemstone laser. The titanium-gemstone laser continuously outputs a pulse laser. The titanium-gemstone laser is connected with the first optical device. The first optical device divides the pulse laser into two beams of light. A beam is as a modulation laser through the third optical device and the fourth optical device is transmitted to the fifth optical device for exciting graphene material. USE - Semiconductor material exciton resonance absorption modulation system for use in an ultra-fast laser pumping detection field. Can also be used in solar photovoltaic field. ADVANTAGE - The system realizes modulation of exciton resonance absorption of two-dimensional semiconductor material so as to ensure integrity of the sample and accuracy of the test result, thus ensuring sample is not damage under precondition of repeatedly detecting. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic block diagram of a semiconductor material exciton resonance absorption modulation system. (Drawing includes non-English language text). 1First optical device 2Second optical device 3Third optical device 4Fourth optical device 5Fifth optical device 6Sixth optical device 7Seventh optical device 8Eighth optical device 9Ninth optical device