• 专利标题:   Single-layer graphene terahertz thermoelectric detector construction and verification method, involves using X-polarization terahertz wave to verify single-layer graphene terahertz thermoelectric detector to obtain temperature difference potential and photoelectric voltage signal.
  • 专利号:   CN115267470-A
  • 发明人:   TANG X, JIA H, TIAN H, ZHU X, YANG D, LI J
  • 专利权人:   UNIV SICHUAN ARTS SCI, UNIV CHENGDU INFORMATION TECHNOLOGY
  • 国际专利分类:   G01R031/26, H01L037/00
  • 专利详细信息:   CN115267470-A 01 Nov 2022 G01R-031/26 202297 Chinese
  • 申请详细信息:   CN115267470-A CN10719309 23 Jun 2022
  • 优先权号:   CN10719309

▎ 摘  要

NOVELTY - Single-layer graphene terahertz thermoelectric detector construction and verification method, involves constructing a full-dielectric substrate. Single layer graphene is obtained. A single-layer graphene terahertz thermoelectric detector is constructed based on the full-dielectric substrate. X-polarization terahertz wave is used to verify the single-layer graphene terahertz thermoelectric detector to obtain temperature difference potential and a photoelectric voltage signal. USE - Single-layer graphene terahertz thermoelectric detector construction and verification method. ADVANTAGE - The method enables constructing and verifying single-layer graphene terahertz thermoelectric detector with simple operational steps, accurately controlling the incident light spot position, and allowing terahertz light spot covering the whole photosensitive region.