• 专利标题:   Evaluating quality of graphene crystal structure comprises obtaining change rule of carrier concentration with time and relationship between carrier mobility and carrier concentration, and determining quality of graphene crystal structure.
  • 专利号:   CN112034008-A
  • 发明人:   LI X, QING F
  • 专利权人:   UNIV CHINA ELECTRONIC SCI TECHNOLOGY
  • 国际专利分类:   G01N027/00
  • 专利详细信息:   CN112034008-A 04 Dec 2020 G01N-027/00 202004 Pages: 6 Chinese
  • 申请详细信息:   CN112034008-A CN10955753 11 Sep 2020
  • 优先权号:   CN10955753

▎ 摘  要

NOVELTY - Evaluating quality of graphene crystal structure comprises (i) doping the graphene film so that the carrier concentration exceeds N, (ii) performing a van der Pauw-Hall measurement on the doped graphene film every 1 to 5 minutes, obtaining the change rule of carrier concentration with time and the relationship between carrier mobility and carrier concentration, and draw a graph, and (iii) finding the corresponding carrier mobility when the carrier concentration is N from the graph, and determining the quality of the graphene crystal structure by comparing the carrier mobility under the same carrier concentration of N. USE - The method is useful for evaluating quality of graphene crystal structure. ADVANTAGE - The method enables measuring carrier mobility under certain carrier concentration so as to obtain an actual value instead of empirical formula derived value directly to compare, so that quality evaluation of the graphene crystal structure is more accurate and reliable.