• 专利标题:   Semiconductor structure for semiconductor device comprises graphene material and graphene-lattice matching material over at least a portion of graphene material.
  • 专利号:   US8901666-B1, WO2015017117-A1, TW201513363-A, TW488310-B1, KR2016018872-A, CN105452162-A, EP3027556-A1, JP2016525790-W, JP6043022-B2, EP3027556-A4, KR1817020-B1, CN109166785-A
  • 发明人:   MEADE R E, PANDEY S C
  • 专利权人:   MICRON TECHNOLOGY INC, MICRON TECHNOLOGY INC, MICRON TECHNOLOGY INC
  • 国际专利分类:   H01L021/02, H01L029/16, H01L029/76, H01L029/94, H01L031/062, H01L031/113, H01L031/119, C01B031/04, H01L029/02, H01L029/78, H01L027/092, H01L029/165, H01L029/51, H01L029/778, C01B031/02, H01L029/786, H01L051/05, H01L051/30, H01L029/423, H01L029/66
  • 专利详细信息:   US8901666-B1 02 Dec 2014 H01L-029/76 201480 Pages: 12 English
  • 申请详细信息:   US8901666-B1 US954017 30 Jul 2013
  • 优先权号:   US954017, WOUS046611, CN80042945, KR702975

▎ 摘  要

NOVELTY - A semiconductor structure (503) contains graphene material and graphene-lattice matching material over at least a portion of graphene material. The graphene-lattice matching material has a lattice constant of plus minus 5% of a multiple of a lattice constant or bond length of the graphene material. USE - A semiconductor structure for semiconductor device e.g. field-effect transistor (FET), diode, triode, and resistant switching device (all claimed). ADVANTAGE - Graphene-lattice matching material may be formed thick enough to prevent leakage or direct tunneling. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are included for: (1) semiconductor device (500) comprising source (501), drain (502), gate structure (504), and semiconducting graphene structure adjacent to source and/or drain; and (2) modification of energy band gap of graphene material which involves forming graphene-lattice matching material over at least a portion of graphene material. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic diagram of the side view of a semiconductor device. Semiconductor device (500) Source (501) Drain (502) Semiconductor structure (503) Gate structure (504)