• 专利标题:   Selection of qualified region of chemical vapor deposited graphene film during fabrication of microelectronics, involves heating chemical vapor deposited graphene film formed on metal substrate using reaction gas, and removing defect.
  • 专利号:   CN104805419-A
  • 发明人:   CHEN Z, LI X, SUI Y, WANG B, ZHANG H, ZHANG Y, YU G
  • 专利权人:   SHANGHAI INST MICROSYSTEM INFORMATION
  • 国际专利分类:   C01B031/04, C23C016/56, C30B033/12
  • 专利详细信息:   CN104805419-A 29 Jul 2015 C23C-016/56 201601 Pages: 10 Chinese
  • 申请详细信息:   CN104805419-A CN10032316 23 Jan 2014
  • 优先权号:   CN10032316

▎ 摘  要

NOVELTY - Selection of qualified region of chemical vapor deposited graphene film involves providing chemical vapor deposited graphene film formed on metal substrate, placing resultant substrate in reaction chamber, heating substrate to predetermined temperature in protective gas atmosphere, introducing reaction gas, reacting the graphene film with reaction gas, detecting defect region and removing defect by etching. USE - Selection of qualified region of chemical vapor deposited graphene film during fabrication of microelectronics. ADVANTAGE - The method enables removal of defect from chemical vapor deposited graphene film by simple process, with high yield.